xtest regression 4007_ecc and 4011 leave generated keys behind
mwasilew opened this issue · 6 comments
When running regression 4007_ecc and regression 4011 with SE050 xtest creates key pairs in the element. These are left behind after the tests complete. After running a few iterations of xtest SE050 runs out of space for creating new keys. IMHO each test should delete the temporary objects once they're no longer used.
Agreed.
Is there an easy way to fix it? I'm not very familiar with xtest code but I think the missing bit is ta_crypt_cmd_free_transient_object
@jforissier I tried to fix the issue, but my knowledge of op-tee is very limited. The key pairs are generated on the se050 when tests call TEE_GenerateKey. This is the case in both tests (4007_ecc and 4011). I think all tests that call ta_crypt_cmd_generate_key will suffer from this issue. I re-ran my tests with level 1. This enables RSA key pair generation in test 4007 and it left 4 more key pairs in the se050. Could you tell me if there is an op-tee method for removing the key pairs from se050 that I can use? I searched the API and nothing stands out.
I don't have an answer but I believe @ldts can help.
yes, it is borken with the regression xtests (not with the pkcs11 ones) : see OP-TEE/optee_os#5086
I suggest using some tool like https://github.com/foundriesio/fio-se05x-cli to clear the device nvm until we have a proposal to the issue above..
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