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Profile
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Weigang He

He is a Research Assistant (Mentor: Ting Su) of East China Normal University (2022-). He is also a Visiting Scholar of Ant Group, Hanzhou, China (2022-). He got his M.S. in software engineering from East China Normal University (ECNU), Shanghai, China (2018-2021).

His research interests are in:

  • Mobile App Analysis and Testing (GUI Fuzzing)
  • Fuzzing Compilers/Program Analyzers

Research Programs

Testing Static Analysis Tools. (Mar.2022 – Aug.2023)

Aims to design an effective fuzzing test scheme to automatically find false negatives, false positives and tool crash defects of the static analysis tools within Ant group and Alibaba.

Design and implementation of a tool to automatically instrument benchmarking apps and measure the testing effects of automated testing tool on the benchmark.

Design and implementation of algorithms to generate high-coverage unit test cases of PLC program for control flow and data flow coverage criteria based on dynamic symbolic execution.

Languages

  • Chinese Native
  • English Proficient IELTS (Academic) Score: 7.0

Publications

  1. Automata-based Trace Analysis for Aiding Diagnosing GUI Testing Tools for Android.
    Enze Ma, Shan Huang, Weigang He, Ting Su*, Jue Wang, Huiyu Liu, Geguang Pu, Zhendong Su
    ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering (FSE), 2023.

  2. Data flow testing for PLC programs via dynamic symbolic execution.
    Weigang He, Xia Mao, Ting Su, Yanhong Huang, and Jianqi Shi.
    28th Asia-Pacific Software Engin eering Conference, APSEC 2021, Taipei, Taiwan, December 6-9, 2021, pages 152–160. IEEE, 2021.

  3. Automated test generation for iec 61131-3 st programs via dynamic symbolic execution.
    Weigang He, Jianqi Shi, Ting Su, Zeyu Lu, Li Hao, and Yanhong Huang.
    Science of Computer Programming, 206:102608, 2021.

  4. Safety verification of iec 61131-3 structured text programs.
    Jiawen Xiong, Xiangxing Bu, Yanhong Huang, Jianqi Shi, and Weigang He.
    IEEE Transactions on Industrial Informatics, 17(4):2632–2640, 2020.