JiangHuiCheShen

Leetcode

machine-learning

机器学习算法岗准备资料

Semiconductor-

Increased yield of semiconductor wafer maps through classification of defective types of semiconductor wafer maps

WaPIRL

'Self-Supervised Representation Learning for Wafer Bin Map Defect Pattern Classification'

JiangHuiCheShen/machine-learning

机器学习算法岗准备资料

JiangHuiCheShen/Leetcode

JiangHuiCheShen/Semiconductor-

Increased yield of semiconductor wafer maps through classification of defective types of semiconductor wafer maps

JiangHuiCheShen/WaPIRL

'Self-Supervised Representation Learning for Wafer Bin Map Defect Pattern Classification'