Dealing with particles is hard. klarfkit makes it easier.
Introduction
klarfkit can be used to analyze semiconductor wafer maps to locate issues with production or failing parts:
Simply load a klarf file, typically with the extension .001
into the WaferMap and generate plots from that klarf
Applications
- Generate a plot to locate defects caused by process variation
- Overlay several KLARF defect files into one wafer map to find hidden process issues
- Color defects on the defect map by time, process, defect class, size, inspector, or any number of KLARF attributes
- Edit KLARF files by exporting the raw data to CSV or Excel formats and importing the data back into KLARF format
- Combine several KLARF files together
Installation
pip install git+https://github.com/MichaelHotaling/klarfkit.git
Contributing
Please refer to the Contributing Guide before creating any Pull Requests. It will make life easier for everyone.
Documentation and tutorials
Questions? Comments? Requests?
Please create an issue in the klarfkit repository.