RRAM testing API (C language) for T5830 Memory Test System.
- Time: ns (1e-9)
- Voltage: V
- Current: nA (1e-9)
typedef int Time_ns;
typedef float Voltage_V;
typedef int Current_nA;
typedef struct {
Voltage_V low;
Voltage_V high;
Time_ns width;
Time_ns delay;
Time_ns hold;
} Pulse;
typedef enum {
REPEAT,
SWEEP,
MANUAL
} PulseTrainMode;
typedef struct {
PulseTrainMode mode;
union {
// REPEAT
int count;
Pulse pulse;
// SWEEP
Pulse start;
Pulse end;
Voltage_V step;
// MANUAL
Pulse * pulses;
} data;
} PulseTrain;
typedef enum {
GROUND,
DIRECT,
SINGLE_PULSE,
PULSE_TRAIN
} TerminalMode;
typedef struct {
char * name;
TerminalMode mode;
union {
// GROUND, DIRECT
Voltage_V level;
// SINGLE_PULSE
Pulse pulse;
// PULSE_TRAIN
PulseTrain pulse_train;
} data;
} Terminal;
typedef struct {
Terminal bl;
Terminal sl;
Terminal wl;
} RRAMConfig;
Current_nA operate(int x_addr, int y_addr, RRAMConfig config)
Current_nA * operate_all(RRAMConfig config)
- ALPG: Algorithmic Pattern Generator
- DBM: Data Buffer Memory
- UBM: Universal Buffer Memory
- TG: Timing Generator
- PDS: Pin Data Selector
- FC: Format Controller
- DR: Driver
- CP: Comparator
- DC: Direct Current
- SC: Sense Controller
- ECC: Error Correct Code Function
- BBM: Bad Block Memory
- FCM: Fail Capture Memory
- PPS: Programmable Device Power Supply
- ADC: Analog Digital Converter
- Main Program (*.c, *.h)
- C program.
- MCI (Macro Control Interface) library functions are needed to access tester hardware.
- Socket File (*.soc)
- The table of DUT and PIN number.
- Pattern Program (*.asc)
- Assembler program of ALPG.