/X-Light

Residual stress determination by X-ray diffraction

Primary LanguagePythonGNU General Public License v3.0GPL-3.0

COPYRIGHT NOTICE

Project: DECORD2D / Residual stress determination

Copyright (C) PHAM Tu Quoc Sang, Institut Jean Lamour, Nancy, France
Principal author: PHAM Tu Quoc Sang (sang.phamtuquoc@gmail.com)

PERMISSION NOTICE

This software is published under the terms of the GNU GPL-3.0-or-later (https://www.gnu.org/licenses/gpl.txt).
The above copyright notice and this permission notice shall be included in all copies or substantial portions of the Software.

DESCRIPTION

X-Light is an open-source software that is written in Python with a graphical user interface. X-Light was developed to determine residual stress by X-ray diffraction. This software can process the 0D, 1D and 2D diffraction data obtained with laboratory diffractometers or synchrotron radiation. X-Light provides several options for stress analysis and five functions to fit a peak: Gauss, Lorentz, Pearson VII, pseudo-Voigt and Voigt. The residual stress is determined by the conventional sin2ψ method and the fundamental method.

For more scientific and algorithmic details, please see the article on the Journal of Applied Crystallography

For software installation and operation, please refer to the User Guide

For portable execution in 64-bit Windows, please download here