/Electrode-Microstructure-and-Interphases-Characterization-by-Combining-ToF-SIMS-and-Machine-Learning

This code allows combining the spatial distribution coming from multiple secondary ions maps obtained through time-of-flight secondary ion mass spectrometry (ToF-SIMS) into a single image and segmenting it (i.e., every pixel is assigned to one SI/phase only).

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