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Reliability-Aware Circuit Design

Brief summary of papers in reliability-aware circuit design

Survey

Title Year Published in Brief Summary
Reliable on-chip systems in the nano-era: Lessons learnt and future trends 2013 DAC reliability concerns and techniques at hardware-level, software-level and application-level
A survey of prediction and classification techniques in multicore processor systems 2018 TPDS Summary prediction methods
A Survey of Aging Monitors and Reconfiguration Techniques 2020 arXiv Summary aging monitors

Aging Monitoring

Title Year Published in Brief Summary
Chip health tracking using dynamic in-situ delay monitoring 2019 DATE monitor multiple paths to get "monitor excitation rate"
Re-using BIST for circuit aging monitoring 2015 ETS reuse BIST
Using programmable delay monitors for wear-out and early life failure prediction 2020 DATE reuse "FAST"
An efficient method to identify critical gates under circuit aging 2007 ICCAD use search algorithm to identify critical gates
Representative critical-path selection for aging-induced delay monitoring 2013 ITC select representative critical-path and predict delay
Circuit failure prediction and its application to transistor aging 2007 VTS monitor guardband violation
Predictive error detection by on-line aging monitoring 2010 IOLTS monitor critical path delay
A distributed critical-path timing monitor for a 65nm high-performance microprocessor 2007 ISSCC monitor critical-path, edge detection
Early Selection of Critical Paths for Reliable NBTI Aging-Delay Monitoring 2016 TVLSI early selection of CPs without spatial correlation information from circuit layout
Aging-and variation-aware delay monitoring using representative critical path selection 2015 TODAES using ML algorithms to select representative CPs

Aging Analysis/Prediction

Title Year Published in Brief Summary
Aadam: A Fast, Accurate, and Versatile Aging-Aware Cell Library Delay Model using Feed-Forward Neural Network 2020 ICCAD Feed-forward network
Prognosis of NBTI aging using a machine learning scheme 2016 DFT multivariate adaptive regression splines
Real-time prediction for IC aging based on machine learning 2019 TIM multivariate adaptive regression splines
Instruction-level NBTI stress estimation and its application in runtime aging prediction for embedded processors 2018 TCAD linear regression
On-line prediction of NBTI-induced aging rates 2015 DATE linear regression
Design of reliable SoCs with BIST hardware and machine learning 2017 TVLSI Compare SVM(with ECC), TreeBagger, random forest, Adaboost, basic regression
Fine-grained aging-induced delay prediction based on the monitoring of run-time stress 2016 TCAD SVM
Aging-aware chip health prediction adopting an innovative monitoring strategy 2019 ASPDAC SVM
Fine-grained aging prediction based on the monitoring of run-time stress using DfT infrastructure 2015 ICCAD SVM
Aging-aware scheduling and binding in high-level synthesis considering workload effects 2020 Microelectronics Reliability SVM
Re-using BIST for circuit aging monitoring 2015 ETS SVM
On-chip droop-induced circuit delay prediction based on support-vector machines 2015 TCAD SVM
Towards Reliability-Aware Circuit Design in Nanoscale FinFET Technology 2017 ICCAD proposed algorithm
NBTI and HCI Aging Prediction and Reliability Screening During Production Test 2019 TCAD proposed algorithm
Circuit aging prediction for low-power operation 2009 CICC Feature modeling, considering low-power technique
Remaining useful life prediction in embedded systems using an online auto-updated machine learning based modeling 2021 Microelectronics Reliability nonlinear autoregressive (NAR) neural network
Statistical reliability analysis under process variation and aging effects 2009 DAC gate aging statistical model
Optimized circuit failure prediction for aging: Practicality and promise 2008 ITC Feature modeling
Unintrusive aging analysis based on offline learning 2017 DFT Generalized Liner Model
A Novel NBTI-Aware Chip Remaining Lifetime Prediction Framework Using Machine Learning 2021 ISQED KNN, RF, SVM, DT, SGD, NB, EN
Aging-Aware Gate-Level Modeling for Circuit Reliability Analysis 2021 IEEE Transactions on Electron Devices multivariate adaptive regression splines(MARS)
Real-Time IC Aging Prediction via On-Chip Sensors 2021 ISVLSI multivariate adaptive regression splines(MARS)

Design Framework

Title Year Published in Brief Summary
Reliability Aware Design and Lifetime Management of Computing Platforms 2017 TETC A comprehensive design flow optimization method
Design for reliability Tradeoffs between lifetime and performance due to electromigration 2021 Microelectronics Reliability DSE towards electromigration
Reliability-and process-variation aware design of integrated circuits 2008 Microelectronics Reliability reliability-aware design for logic and memory circuits
Reliability-Enhanced Circuit Design Flow Based on Approximate Logic Synthesis 2020 GLSVLSI A reliability-enhanced design framework based on approximate synthesis